The new issue of International Journal of Affective Engineering is now available.
November 30, 2016 [New issue]
The new issue of International Journal of Affective Engineering is now available.
Vo.15 No.4
Special Issue on ICBAKE 2015
Original Articles
A Study of Cancelable Biometrics in the Security Improvement of Biometric Authentication System using Fault Tree Analysis／Sanggyu SHIN, Yoichi SETO and Shogo SHIMIZU／pp. 351-359
News | 2016/11/30